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R05Research Domain · Secure SoCs, PQC & Fault Analysis

Hardware Security, Post-Quantum Cryptography & Trustworthy Silicon

Hardware security research in Post-Quantum Cryptography (PQC), Physical Unclonable Functions (PUF), RISC-V functional fault modeling, and side-channel resistance at I²CS Lab, IIIT Kottayam.

Domain Overview & Research Focus

As connected edge devices and mission-critical SoCs proliferate, security must be rooted directly in silicon. The Hardware Security group at I²CS Research Lab, IIIT Kottayam investigates cryptographic hardware accelerators, in-field fault detection for RISC-V processors, and trustworthy IC design.

Our researchers collaborate internationally—including with Ruhr University Bochum and TU Dresden (Germany)—and recently won both 1st Prize and 3rd Prize at the 10th International Test Conference (ITC) India Hackathon as well as acceptance at the 40th VLSI Design Conference (VLSID 2027) for observability-driven in-field fault detection in RISC-V cores.

Key Research Subtopics & Methodologies

In-Field Fault Detection & RISC-V Reliability

Observability-driven RTL fault injection, functional test program generation, and interface-level monitoring to detect permanent and transient faults in RISC-V cores.

Lightweight & Post-Quantum Cryptographic (PQC) Hardware

High-speed polynomial multiplication (NTT) and low-area cryptographic co-processors for resource-constrained IoT and edge SoCs.

Optical Interconnect & NoC Fault Modeling

Fault modeling, diagnosis, and resilient routing for Silicon Photonic and on-chip interconnect architectures.

Hardware Root-of-Trust & Side-Channel Resilience

Physical Unclonable Functions (PUFs), true random number generators (TRNGs), and countermeasures against power and fault-injection attacks.

Sponsored Projects & Patents

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Completed Project

Faculty Development Programme on "Quantum Computing"

Agency: AICTE- ATAL · Grant: 0.93 Lakhs

Selected Publications (14)

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2027conference

Measuring Interface Observability for In-Field Fault Detection in RISC-V Cores

Alan Thomas Paul, Niranjan K S, Adithya Prabhu, Kevin Jose, Kala S, Nalesh S · 40th IEEE International Conference on VLSI Design and 26th International Conference on Embedded Systems (VLSID 2027), Jan 2-16, 2027, Bengaluru, India

2026conference

A Multi-Stage Hybrid Approach to Cryptocurrency Return Prediction

N Harshitha, Aparna Nair M K, Kala S, Nalesh S · IEEE International Conference on Smart Electronics and Communication Systems (ISENSE), December 11-12, 2026, Kerala, India

2026conference

Block Floating Point Based Matrix Multiplication Accelerator with Hardware Efficient Exponent Alignment

Shravan Narayan Sunil, Joel Dan Philip, Kala S, Nalesh S · 30th International Symposium on VLSI Design and Test (VDAT-2026), Noida, August 20-22, 2026, India

2026conference

Design and Hamiltonian Characterization of 4-Qubit Flip-Chip Transmon-Based Quantum Random Number Generator

Niranjan K S, Alan Thomas Paul, Prashamol Prakshan, Kala S, Nalesh S · IEEE Computer Society Annual Symposium on VLSI (ISVLSI) 2026, July 7-10, 2026, Kolkata, India

2026chapter

Efficient Quantum Cryptography in Industrial IoT for Optimized Performance Energy and Resource Utilization

Prashamol Prakashan, Nalesh S, Kala S · Quantum Cryptography and Annealing for Securing Industrial IoT, Elsevier, pp 1-11, 2026. ISBN: 978-0-443-38349-6

2025conference

Quantized Residual CNN on FPGA for Real-Time Driver Attention Detection Using hls4ml

Joel Dan Philip, Asif Muhammed, Nalesh S, Kala S · 29th International Symposium on VLSI Design and Test (VDAT-2025), Chandigarh, August 7-9, 2025, India (Best Paper Award)

2025conference

Hybrid FSR-based Pseudo-Random Number Generator on FPGA for Encrypting Biometrics

Keerthana Menon, Goutam Mali, Nalesh S, Babita Jajodia, Kala S · IEEE 37th International Conference on Microelectronics (ICM) 2025 , December 14-17, 2025, Cairo, Egypt

2025conference

K-means Clustering for Image Segmentation Using Approximate Booth Multiplier

Rachana George, Kala S and Nalesh S · 2nd IEEE International Conference on Trends in Engineering Systems and Technologies (ICTEST), April 3-5, 2025, Kerala, India.

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